75210 Electron Microscopy Sciences Standard Pin Stub SEM Mount Slotted Head

Description

The Electron Microscopy Sciences Standard Pin Stub SEM Mount features a slotted 1/2″ head designed for secure specimen placement in Scanning Electron Microscopes. Constructed from aluminum, this mount is engineered for reliable performance in microscopy applications. It is specifically designed to hold a FIB sample mounted on a standard 1/2″ (12.7mm) pin stub for FIB analysis.

• Constructed from aluminum.
• Features a slotted 1/2″ head.
• Designed for standard 1/2″ (12.7mm) pin stubs.

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