Description
This JEOL Aluminum SEM Mount from Electron Microscopy Sciences is designed for use in scanning electron microscopy. It features dimensions of 25 mm by 12.7 mm, with a head diameter of approximately 0.93 inches (23.7mm). This mount is constructed from durable aluminum and is capable of holding multiple pin-type specimens, accommodating up to 40 x 12.7mm pins. It is an essential accessory for sample preparation in SEM applications.
- Constructed from aluminum for durability.
- Designed for JEOL SEM systems.
- Accommodates standard pin-type specimens.
Upgrade your SEM sample preparation with this reliable aluminum mount.
Reviews
There are no reviews yet.