Description
The Electron Microscopy Sciences Universal Vise (MPN: 75950-01) is designed for efficiently holding specimens during Scanning Electron Microscopy (SEM) procedures. This vise features a single set screw for quick and secure specimen loading, ensuring ease of use in demanding laboratory environments. Its compact jaw dimensions are optimized for precise sample manipulation.
- Single set screw loading for fast specimen handling.
- Designed for use in SEM applications.
- Durable construction for reliable performance.
Upgrade your SEM workflow with the reliable performance of this Universal Vise.
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