Description
This NE10A Indexed Grid Graticule from Electron Microscopy Sciences is designed for precise measurement and calibration in microscopy applications. It features a numbered grid pattern with a 0.5mm pitch, providing a clear reference for sample analysis. The graticule is manufactured with a surface chrome image for durability and visibility. This specific model is the 19mm variant, ensuring compatibility with a range of eyepiece setups.
- Numbered grid pattern for precise measurements
- 0.5mm pitch for detailed analysis
- Durable surface chrome image
- 19mm diameter for versatile use
Enhance your microscopy workflow with this high-quality indexed grid graticule.
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