75692 Electron Microscopy Sciences JEOL Aluminum SEM Mount, 25 x 12.7 mm

Description

This JEOL Aluminum SEM Mount from Electron Microscopy Sciences is designed for precise sample placement in scanning electron microscopy applications. It features dimensions of 25 mm by 12.7 mm, providing a stable platform for specimen preparation. Constructed from durable aluminum, this mount ensures reliable performance in demanding laboratory environments. It is specifically designed to accommodate JEOL SEM systems, facilitating efficient workflow and accurate imaging.

• Constructed from aluminum for durability.
• Designed for JEOL SEM systems.
• Precise 25 mm x 12.7 mm dimensions.

Enhance your microscopy workflow with this essential SEM mount.