Description
These SEM aluminum mounts from Electron Microscopy Sciences are designed to hold specimens at a 45-degree angle, facilitating detailed imaging. The mounts feature a head with specific dimensions for secure specimen placement. They are constructed from durable aluminum, ensuring reliability in SEM applications. These mounts are essential for achieving precise sample orientation during scanning electron microscopy analysis.
- Designed for 45° angle specimen mounting
- Durable aluminum construction
- Specific head dimensions for secure placement
Explore the quality and precision of Electron Microscopy Sciences products for your laboratory needs.
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