75220 Electron Microscopy Sciences Standard Pin Stub SEM Mount Slotted Head

Description

This Standard Pin Stub SEM Mount features a slotted head designed for secure specimen mounting in Scanning Electron Microscopy applications. Constructed from aluminum, it is compatible with various SEM systems including Cambridge, Leo, Philips, FEI/Philips, Phenom, CamScan, and Tescan. The mount is specifically designed to hold a FIB sample mounted on a standard 1/2″ (12.7mm) pin stub, ensuring reliable sample positioning for detailed analysis.

• Aluminum construction for durability.
• Slotted head design for secure specimen attachment.
• Compatible with a wide range of SEM systems.
• Designed for standard 1/2″ (12.7mm) pin stubs.

Enhance your microscopy workflow with this essential SEM specimen mount.