Description
This aluminum mount is specifically designed for the JEOL JSM 840 scanning electron microscope. It features a standard aluminum construction, ensuring compatibility and reliable performance for sample preparation and analysis. The mount provides a secure platform for specimens, facilitating detailed imaging and examination within the microscope’s vacuum environment. It is engineered to meet the rigorous demands of electron microscopy applications.
- Standard aluminum construction
- Designed for JEOL JSM 840 SEM
- Dimensions: 31.5 x 20 mm
Upgrade your microscopy workflow with this essential JEOL JSM 840 aluminum mount.
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