75830-30 Electron Microscopy Sciences JEOL SEM Mount, 25 x 20 mm

Description

This SEM Mount is specifically designed for JEOL scanning electron microscopes, offering precise sample placement. Constructed from aluminum, it features dimensions of 25 mm by 20 mm, ensuring compatibility with standard JEOL SEM systems. This mount is a reliable choice for researchers requiring accurate sample handling in electron microscopy applications.

• Designed for JEOL SEM systems
• Constructed from aluminum
• Dimensions: 25 mm x 20 mm

Order your JEOL SEM Mount today for optimal sample preparation!