Description
These SEM Clip Specimen Mounts from Electron Microscopy Sciences are designed for use with ZEISS/LEO SEM/FIBs. They feature a 25mm pin mount with a 6mm pin height, ensuring secure and reliable specimen placement for electron microscopy applications. Manufactured with precision, these mounts are essential for obtaining high-quality imaging results in demanding laboratory environments.
- Designed for ZEISS/LEO SEM/FIBs
- Features a 25mm pin mount
- Includes a 6mm pin height
- Ensures secure specimen placement
Enhance your microscopy workflow with these high-quality SEM clip specimen mounts.




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