Description
This Grating Replica specimen from Electron Microscopy Sciences features a cross-line pattern designed for calibration and imaging in electron microscopy. It is a replica of a diffraction grating with a density of 2,160 lines per millimeter, providing precise measurement capabilities for both scanning and transmission electron microscopy applications. The specimen is manufactured to ensure accurate magnification checks and detailed analysis of structures.
- Replica of a 2,160 lines/mm diffraction grating.
- Features a cross-line pattern for detailed analysis.
- Suitable for magnification checks in electron microscopy.
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